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The data general line test circuit

2016-10-14 02:53  
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The data general line test circuit
The circuit can judge the data change, lock and output the strobe pulse. In the figure, we assume it is the 4-bit general line(more bit analogy). Usually, each OR gate outputs 0 , and the strobe output is also 0 . If each input terminal changes its state, the corresponding OR gate will output 1 quickly, the jump is fed back to 4 clock terminals of D trigger, which locates the general line. Then, all of the 4 OR gates output the low LEV.